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Electrical and Computer Engineering illustration

Faculty & Staff

Rauch, Stewart

Ph.D. in Electrical Engineering from Lehigh University, Bethlehem, PA

Adjunct Faculty

Department: Elect. & Comp. Engineering

Career History

See CV.

Teaching Interests

EGE593-04 Semiconductor Reliability (Spring '14)

Research/Creative Activity

Major fields of research interest are: CMOS device hot carrier and bias temperature instability, and radiation-induced soft error rate. All three topics address important trends as IC technology is scaled from the micro to the nano regime. These are:
1. Ramifications of quasi-ballistic and ballistic transport.
2. Dominance and increasing non-normality of random fluctuation (intrinsic variation) statistics.
3. Increase of radiation induced multiple cell upset soft error rate.


See link:

Committee Memberships & Professional Organizations

Senior Member, IEEE
Member of IEEE Electron Devices and Reliability Societies
Member-at-Large, Hudson Valley EDS chapter
EDS Distinguished Lecturer

Link to CV