Ph.D. in Electrical Engineering from Lehigh University, Bethlehem, PA
Office: REH 217
Phone: (845) 257-3887
EGE593-04 Semiconductor Reliability (Spring '14)
Major fields of research interest are: CMOS device hot carrier and bias temperature instability, and radiation-induced soft error rate. All three topics address important trends as IC technology is scaled from the micro to the nano regime. These are:
1. Ramifications of quasi-ballistic and ballistic transport.
2. Dominance and increasing non-normality of random fluctuation (intrinsic variation) statistics.
3. Increase of radiation induced multiple cell upset soft error rate.
See link: scholar.google.com/citations?user=Q-KSAboAAAAJ
Committee Memberships & Professional Organizations
Senior Member, IEEE
Member of IEEE Electron Devices and Reliability Societies
Member-at-Large, Hudson Valley EDS chapter
EDS Distinguished Lecturer